Characterization methods for solid surfaces and nanomaterials

Description

Introduction to the main spectroscopic and microscopic techniques for the analysis of solid surfaces and nanomaterials:
- Introduction to solid surfaces and interfaces. Basic principles of surface spectroscopy.
- Introduction to Vacuum technology.
- Photoelectron and Auger electron spectroscopies (XPS, UPS, AES).
- Thermal desorption spectroscopies (TDS,TPR ext).
- Ion spectroscopies (SIMS, LEIS).
- Vibrational spectroscopies (IR, EELS).
- Basic techniques to determine the surface structure (LEED, RHEED, PED ext).
- Surface microscopy and related techniques (AFM, STM, SEM, TEM).
- Synchrotron radiation and surface analysis (X-ray absorption EXAFS & SEXAFS, X-ray microscopy SPEM, ext.)
- Analysis of nano-scale materials using surface sensitive techniques.
- Research strategies and Case studies related to Catalyst Characterization.
- Visit to the Surface Analysis Laboratory (optional)
 

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